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The XMIR-990 FT-IR Spectrometer is a CE-certified, high-performance Fourier Transform Infrared Spectrometer developed through independent research and engineering. Designed for precision, reliability, and ease of use, it offers convenient installation, simple operation, and low maintenance requirements.
As one of the most competitive FT-IR spectrometers from China, the XMIR-990 is widely used across materials science, biopharmaceuticals, petrochemicals, food safety, and quality control laboratories. It is also extensively adopted by universities and research institutions for scientific research and academic teaching.
Equipped with a high-resolution Michelson interferometer, DLATGS detector, and high-stability optical components sourced from the USA, the instrument delivers excellent spectral accuracy, repeatability, and signal-to-noise performance. The XMIR-990 is an ideal solution for qualitative and quantitative infrared analysis in both industrial and academic environments.
Availability: In Stock
| Parameter | Details |
|---|---|
| Wave Number Range | 7800 ~ 375 cm⁻¹ |
| Interferometer | Michelson interferometer, 30° incidence angle |
| 100%T Line Tilt Range | Better than 0.5%T (2200–1900 cm⁻¹) |
| Resolution | 1 cm⁻¹ |
| Wave Number Repeatability | 1 cm⁻¹ |
| Wave Number Accuracy | ±0.01 cm⁻¹ |
| Signal-to-Noise Ratio | 30,000:1 (DLATGS, @4 cm⁻¹) |
| Detector | High-resolution DLATGS with moisture-proof coating |
| Beamsplitter | KBr coated with Ge (USA) |
| Light Source | Long-life, air-cooled IR source (USA) |
| Electronic System | 24-bit A/D, 500 MHz, USB 2.0 |
| Power Supply | 110–220V AC, 50–60Hz |
| Dimensions | 450 × 350 × 235 mm |
| Weight | 14 kg |
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